Test Circuits for d? Defects Oriented CMOS analog and num? America

Posted on September 6, 2010, 4:47 pm

Product testing DescriptionDefect East? E is call? ? play an r? important in the g? n? rations? future technology. feature sizes, small and large sizes will die more sensitive to CI? defects that can not? be mod? read? s by traditional approaches to mod? lisat fault. Moreover, the intensification of the int? Integration, an integrated circuit? Gr? may contain different building blocks. These blocks include logic num? America, APA, m? Moire volatile and nonvolatile, and analog interfaces. For these Bui. . . More>>

Test Circuits for d? Defects Oriented CMOS analog and num? America