Test circuits for defects Oriented CMOS analog and digital

Posted on April 2, 2010, 4:47 am

Product testing DescriptionDefect oriented will play an important role in future generations of technology. feature sizes, small and large sizes will die ICs more sensitive to defects that can not be modeled by traditional approaches to modeling fault. Moreover, the intensification of integration, an integrated circuit may contain several building blocks. These blocks include digital logic, APA, volatile and nonvolatile memory and analog interfaces. To these various Bui. . . More>>

Test circuits for defects Oriented CMOS analog and digital