Reliability Wearout Mechanisms in Advanced CMOS Technologies

Posted on April 20, 2010, 11:03 pm

• ISBN13: 9780471731726
• Condition: NEW
• Notes: Brand New from Publisher. No Remainder Mark.

Product DescriptionA comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relat. . . More >>

Reliability Wearout Mechanisms in Advanced CMOS Technologies