Posts Tagged ‘Testing’

Sound System Setup / Testing Software

Wednesday, June 22nd, 2011

Audio Quicktest (aqt) is a powerful sound setup tool. It includes a tone generator, pink noise, “dry instrument” (anechoic) generator, channel checks and more. Use it for strereos, church PAs, recording studios, home theaters, car audio systems and more.
Sound System Setup / Testing Software

Design technology controlled analog? Their fuzzy logic in CMOS: Implementation, testing and implementation

Wednesday, September 15th, 2010

Product DescriptionText covers setting? Implement, test and implementation of programmable and reconfigurable contr? Their analog Fuzzy Logic in standard CMOS technology. Addresses the analysis and design of basic building blocks of analog and began implementing a time r? El fuzzy logic. Pr? L? Tively is performed? ? from the initial registration th? is the author’s Ph. D, and is designed for researchers and? students. . . . More>>

Design technology controlled analog? Their fuzzy logic in CMOS: Implementation, testing and implementation

Testing for defects oriented nanometer CMOS VLSI

Monday, August 9th, 2010

process tolerances DescriptionFailures technology products with nano-metric for failure and reduced to give rise to significant challenges for IC testing. As the variation of basic parameters such as channel length, threshold voltage, the thin oxide thickness and interconnect dimensions is well beyond acceptable limits, new test methods and a deeper understanding of physics Vice-fault mappings are needed. Testing for defect oriented nanometer CMOS VLSI C.. . More>>

Testing for defects oriented nanometer CMOS VLSI

Defect Oriented Testing for CMOS Analog and Digital Circuits

Thursday, May 27th, 2010

Product DescriptionDefect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse bui. . . More >>

Defect Oriented Testing for CMOS Analog and Digital Circuits

Iddq Testing for CMOS VLSI

Thursday, April 15th, 2010

Product DescriptionGives an introduction to physical defects and bridging faults in CMOS ICs. Also discusses the use of Iddq testing in IC production lines. DLC: Iddq testing. . . . More >>

Iddq Testing for CMOS VLSI

Defect-Oriented Testing for Nano-metric CMOS VLSI Circuits

Sunday, March 28th, 2010

DescriptionFailures produces nano-metric technologies owing to defects and reducing process tolerances give rise to significant challenges for IC testing. As the variation of basic parameters such as channel length, threshold voltage, oxide thickness and interconnect thin dimensions is well beyond acceptable limits, methods of testing new and deeper understanding of the Vice-physical mappings vulnerability are needed. In Defect-Oriented Testing for Nano-metric CMOS VLSI C.. . More>>

Defect-Oriented Testing for Nano-metric CMOS VLSI Circuits